ASTM F24-20

Detailinformationen

Bezeichnung: ASTM F24-20

Ausgabedatum: 01.04.2020

Seiten: 4

Land: Amerikanische technische Norm

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Annotation

This test method establishes the standard procedures for measuring and quantizing the size distribution of particulate contamination either on, or washed from, the surface of small electron-device components. The apparatuses and reagents required for this test are also enumerated herein. The number of required test specimens is governed by the dimensions of the component or surface being analyzed. Results shall be interpreted as particles per component or particles per square centimetre of component surface.


Keywords:
optical particle counting, particulate contamination, size distribution analysis, surfaces,, ICS Number Code 17.040.20 (Properties of surfaces)