IEC/TS 62876-4-1-ed.1.0

Detailinformationen

Bezeichnung: IEC/TS 62876-4-1-ed.1.0

Ausgabedatum: 25.02.2025

Seiten: 24

Land: Internationale technische Norm

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Erhältlich auf www.technormen.de

Annotation

IEC TS 62876-4-1:2025, which is a Technical Specification, establishes a general reliability testing programme to verify the reliability of the performance of quantum dots nanomaterials, and quantum dot enabled light conversion films (Q-LCFs). The Q-LCF is used as subassemblies for the fabrication of nano-enabled photoelectrical display devices, mainly liquid crystal display (LCD) currently, with other components. This testing programme defines standardized aging conditions, methodologies and data assessment for Q-LCF product. The results of these tests define a stability under standardized aging conditions for quantitative evaluation of the reliability of the Q-LCF. The procedures specified in this document were designed for Q-LCF but can be extended to serve as a guideline for other kinds of light conversion films or related subassemblies as well.