IEC 61788-7-ed.3.0

Detailinformationen

Bezeichnung: IEC 61788-7-ed.3.0

Ausgabedatum: 20.03.2020

Seiten: 87

Land: Internationale technische Norm

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Annotation

IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows: - Frequency: 8 GHz < f < 30 GHz - Measurement resolution: 0,01 m ohm at 10 GHz The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added; b) precision and accuracy statements have been converted to uncertainty; c) reproducibility in surface resistant measurement has been added. IEC 61788-7:2020 decrit le mesurage de la resistance de surface (Rs) des supraconducteurs aux hyperfrequences par la methode normalisee a deux resonateurs. Lobjet du mesurage est la dependance de la resistance de surface Rs vis-a-vis de la temperature a la frequence de resonance. La plage de mesures applicable des resistances de surface Rs pour cette methode est la suivante: - Frequence: 8 GHz < f < 30 GHz - Resolution de mesure: 0,01 m ohm a 10 GHz Les donnees de Rs a la frequence mesuree, et celles mises a lechelle a 10 GHz, en prenant pour hypothese la regle de comparaison f 2, doivent etre consignees. Cette troisieme edition annule et remplace la deuxieme edition parue en 2006. Cette edition constitue une revision technique. Cette edition inclut les modifications techniques majeures suivantes par rapport a ledition precedente: a) l’ajout de l’Annexe B informative, incertitude type composee relative pour le mesurage de la resistance de surface; b) les declarations de fidelite et dexactitude ont ete converties en incertitude; c) lajout de la reproductibilite du mesurage de resistance de surface.