IEC 62899-402-8-ed.1.0

Detailinformationen

Bezeichnung: IEC 62899-402-8-ed.1.0

Ausgabedatum: 04.06.2026

Seiten: 29

Land: Internationale technische Norm

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Erhältlich auf www.technormen.de

Annotation

IEC 62899-402-8:2026 specifies the measurement methods of the dimensions of the shape patterns in printed electronics. These printed patterns are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for vertical variance in IEC TR 62899-402-4 in printed electronics. NOTE The measurement methods of dimensions of the shape patterns considering three-dimensional characteristics can be developed later after the measurement methods for vertical variance are established.