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Tracked Changes. Obsolescence management.
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High density recording format on CD-R/RW disc system. HD-BURN format.
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Semiconductor devices. Constant current electromigration test.
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Semiconductor devices. Hot carrier test on MOS transistors.
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Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
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Semiconductor devices. Metallization stress void test.
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Control technology. Rules for the designation of measuring instruments.
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Concentric lay stranded overhead electrical conductors containing one or more gap(s).
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Electronics assembly technology. Electronic modules.
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Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses.
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