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Surface chemical analysisChemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
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Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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Microbeam analysisGuidelines for orientation measurement using electron backscatter diffraction
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Surface chemical analysis—X-ray photoelectron spectroscopy—Guidelines for analysis
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Microbeam analysisElectron probe microanalysisGuidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
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Measurment method and evaluating of the antibacterial characteristics of photocatalysis materials under visible light irridation
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Testing method on adhesion of fine ceramic coatingsScratching
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Determination of the thermal resistance of low-density blanket-type mineral fiber insulation
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Standard test method for compressibility and recovery of laminated composite gasket materials
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Standard test method for creep relaxation of laminated composite gasket materials
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