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Test method for dislocation density of diamond single crystal polished wafer
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
Determination of iron, aluminum and calcium of silicon nitride powder—Inductively coupled plasma atomic emission spectrometry
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
Test method for stacking faults of polished monocrystalline silicon carbide wafers
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
Test method for thermal expansion rate of thin-walled tube of carbon fiber reinforced composite
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
Additive manufacturing—Aluminum alloy by powder bed fusion
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
Determination of phenol in dye products
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
Test method for the mean and distribution of diameter for reinforcement fibers and micro fiber cotton—Digital optical scanner
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
Test method for static load peeling performance of adhesive tape
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
Determination of chromium() in dye products
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
Test method for determining geometrical parameters of patterns on patterned sapphire substrate
Available languages: English, Chinese
Available design: electronic design (pdf), Print design