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GB - Chinese national standards
Page 5292
GB/T 6609.7-2004 (05/02/2004)
Chemical analysis methods and determination of physical performance of alumina--Determination of titanium dioxide content--Diantiprylmehane photometric method
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 150.90 EUR more info
GB/T 6609.7-2026 (25/05/2026)
Chemical analysis methods and determination of physical performance of alumina—Part 7:Determination of titanium dioxide, chromium sesquioxide, cupric oxide,fluorine, chlorine, boron trioxide, phosphorus pentoxide, sulfate contents—Spectrophotometry method
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 824.10 EUR more info
GB/T 6609.8-2004 (05/02/2004)
Chemical analysis methods and determination of physical performance of alumina--Determination of chromium sesquioxide content--Diphenyl carbazide photometric method
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 150.90 EUR more info
GB/T 6609.9-2004 (05/02/2004)
Chemical analysis methods and determination of physical performance of alumina--Determination of cupric oxide content--29-Dimethyl-110 phenanthroline photometric method
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 150.90 EUR more info
GB/T 661-2011 (12/05/2011)
Chemical reagent - Ammonium iron(II) sulfate hexahydrate
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 226.90 EUR more info
GB/T 6611-2025 (05/10/2025)
Terminology and atlas for titanium and titanium alloys
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 997.90 EUR more info
GB/T 6614-2014 (03/09/2014)
Titanium and titanium alloy castings
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 162.90 EUR more info
GB/T 6616-2023 (06/08/2023)
Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 292.10 EUR more info
GB/T 6617-2009 (30/10/2009)
Test method for measuring resistivity of silicon wafer using spreading resistance probe
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 205.20 EUR more info
GB/T 6618-2009 (30/10/2009)
Test method for thickness and total thickness variation of silicon slices
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 248.70 EUR more info
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