GB - Chinese national standards

General rules for measurement of length in micron scale by SEM

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Specification for a universal wafer grid

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Specification for establishing a wafer coordinate system

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Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods

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Titanium and titanium alloy dics and ring

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Paper and board—Measurement of water contact angle by optical methods

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Determinating the kincmatic viscosity of plasticizers

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Lasers and laser-related equipment—Test methods for laser-induced damage threshold—Part 1:Definitions and general principles

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Lasers and laser-related equipment—Test methods for laser-induced damage threshold—Part 2: Threshold determination

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Lasers and laser-related equipment—Test methods for laser-induced damage threshold—Part 3:Assurance of laser power(energy)handing capabilities

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