IEC - International electro-technical commission

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction

Available languages: English

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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
(Mesure des parametres des quartz piezoelectriques par la technique de phase nulle dans le circuit en pi. Deuxieme partie: Methode de decalage de phase pour la mesure de la capacite dynamique des quartz)

Available languages: Russian, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
(Mesure des parametres des quartz piezoelectriques par la technique de phase nulle dans le circuit en pi. Partie 4: Methode pour la mesure de la frequence de resonance a la charge fL et de la resistance de resonance a la charge RL et pour le calcul des autres valeurs derivees des quartz piezoelectriques, jusqu´a 30 MHz)

Available languages: Russian, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
(Mesure des parametres des resonateurs a quartz - Partie 5: Methodes pour la determination des parametres electriques equivalents utilisant des analyseurs automatiques de reseaux et correction des erreurs)

Available languages: English and French

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Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
(Mesure des parametres des resonateurs a quartz - Partie 6: Mesure de la dependance du niveau d’excitation (DNE))

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
(Mesure des parametres des resonateurs a quartz - Partie 7: Mesure des baisses de l´activite et de la frequence des resonateurs a quartz)

Available languages: English, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
(Mesure des parametres des resonateurs a quartz - Partie 8: Dispositif d´essai pour les resonateurs a quartz montes en surface)

Available languages: English, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
(Mesure des parametres des resonateurs a quartz - Partie 9: Mesure des resonances parasites des resonateurs piezoelectriques)

Available languages: English, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Basic and safety principles for man-machine interface, marking and identification - Identification of equipment terminals, conductor terminations and conductors
(Principes fondamentaux et de securite pour les interfaces hommes-machines, le marquage et l’identification - Identification des bornes de materiels, des extremites de conducteurs et des conducteurs)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM