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Amendment 1 - General requirements for arc fault detection devices
(Amendement 1 - Exigences generales des dispositifs pour la detection de defauts d´arc)
Available languages: Spanish, English and French
Available design: electronic design (pdf), Print design, CD-ROM
Amendment 2 - General requirements for arc fault detection and protection devices (AFDDs)
(Amendement 2 - Exigences generales des dispositifs pour la detection et la protection de defaut d´arcs (DPDA))
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
Corrigendum 1 - Amendment 2 - General requirements for arc fault detection and protection devices (AFDDs)
(Corrigendum 1 - Amendement 2 - Exigences generales des dispositifs pour la detection et la protection de defaut d´arcs (DPDA))
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
Corrigendum 1 - General requirements for arc fault detection devices
(Corrigendum 1 - Exigences generales des dispositifs pour la detection de defaut d´arcs)
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
General requirements for arc fault detection devices
(Exigences generales des dispositifs pour la detection de defauts d´arc)
Available languages: English and French
Available design: electronic design (pdf), CD-ROM
General requirements for arc fault detection and protection devices (AFDDs)
(Exigences generales des dispositifs pour la detection et la protection de defaut d´arcs (DPDA))
Available languages: English and French
Available design: electronic design (pdf), CD-ROM
Nanomanufacturing - Key control characteristics - Part 11-1: Electromagnetic compatibility - Shielding effectiveness of nanomaterials: near-field probe method
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
Nanomanufacturing - Key control characteristics - Part 12-3: 2D material-related products - Schottky barrier heights of 2D material-based field-effect transistors: temperature-dependent current–voltage measurements
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
Nanomanufacturing - Key control characteristics - Part 2-4: Carbon nanotube materials - Test methods for determination of resistance of individual carbon nanotubes
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM