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IEEE 1145-1990 (27.11.1990)

IEEE 1145-1990 (27/11/1990) Withdrawn

IEEE Recommended Practice for Installation and Maintenance of Nickel-Cadmium Batteries for Photovoltaic (PV) Systems

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 115.00 USD more info
IEEE 1145-1999 (7.2.2000)

IEEE 1145-1999 (07/02/2000) Withdrawn

IEEE Recommended Practice for the Installation and Maintenance of Nickel-Cadmium Batteries for Photovoltaic (PV) Systems

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 94.00 USD more info
IEEE 1147-1991 (10.2.1992)

IEEE 1147-1991 (10/02/1992) Withdrawn

IEEE Guide for the Rehabilitation of Hydroelectric Power Plants

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 202.00 USD more info
IEEE 1147-2005 (22.3.2006)

IEEE 1147-2005 (22/03/2006) Withdrawn

IEEE Guide for the Rehabilitation of Hydroelectric Power Plants

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 119.00 USD more info
IEEE 1149.1-1990 (21.5.1990)

IEEE 1149.1-1990 (21/05/1990) Withdrawn

IEEE Standard Test Access Port and Boundary-Scan Architecture

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 166.00 USD more info
IEEE 1149.1-2001 (23.7.2001)

IEEE 1149.1-2001 (23/07/2001) Withdrawn

IEEE Standard Test Access Port and Boundary Scan Architecture

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 174.00 USD more info
IEEE 1149.1-2013 (13.5.2013)

IEEE 1149.1-2013 (13/05/2013) Withdrawn

IEEE Standard for Test Access Port and Boundary-Scan Architecture

Available languages: English

Available design: electronic (protected pdf) - Immediate download, Print design

from 344.00 USD more info
IEEE 1149.1b-1994 (1.3.1995)

IEEE 1149.1b-1994 (01/03/1995) Withdrawn

IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 153.00 USD more info
IEEE 1149.4-1999 (20.3.2000)

IEEE 1149.4-1999 (20/03/2000) Withdrawn

IEEE Standard for a Mixed-Signal Test Bus

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 150.00 USD more info
IEEE 1149.4-2010 (18.3.2011)

IEEE 1149.4-2010 (18/03/2011) Withdrawn

IEEE Standard for a Mixed-Signal Test Bus

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 276.00 USD more info
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