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IEEE 145-1983 (22.6.1983)

IEEE 145-1983 (22/06/1983) Withdrawn

IEEE Standard Definitions of Terms for Antennas

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 58.00 USD more info
IEEE 145-1993 (18.7.1993)

IEEE 145-1993 (18/07/1993) Withdrawn

IEEE Standard Definitions of Terms for Antennas

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 175.00 USD more info
IEEE 145-2013 (6.3.2014)

IEEE 145-2013 (06/03/2014) Withdrawn

IEEE Standard for Definitions of Terms for Antennas

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 87.00 USD more info
IEEE 1450-1999 (1.9.1999)

IEEE 1450-1999 (01/09/1999) Withdrawn

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 399.00 USD more info
IEEE 1450.1-2005 (30.9.2005)

IEEE 1450.1-2005 (30/09/2005) Withdrawn

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 389.00 USD more info
IEEE 1450.2-2002 (18.3.2003)

IEEE 1450.2-2002 (18/03/2003) Withdrawn

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 225.00 USD more info
IEEE 1450.3-2007 (7.9.2007)

IEEE 1450.3-2007 (07/09/2007) Withdrawn

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 153.00 USD more info
IEEE 1450.6-2005 (5.4.2006)

IEEE 1450.6-2005 (05/04/2006) Withdrawn

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)

Available languages: English

Available design: electronic (protected pdf) - Immediate download, Print design

from 153.00 USD more info
IEEE 1450.6.1-2009 (13.7.2009)

IEEE 1450.6.1-2009 (13/07/2009) Withdrawn

IEEE Standard for Describing On-Chip Scan Compression

Available languages: English

Available design: electronic (protected pdf) - Immediate download, Print design

from 146.00 USD more info
IEEE 1451.0-2007 (21.9.2007)

IEEE 1451.0-2007 (21/09/2007) Withdrawn

IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) Formats

Available languages: English

Available design: electronic (protected pdf) - Immediate download

from 186.00 USD more info
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