Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
IEEE - Advanced technology for mankind
Page 256
IEEE 145-1983 (22/06/1983) Withdrawn
IEEE Standard Definitions of Terms for Antennas
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 58.00 USD more info
IEEE 145-1993 (18/07/1993) Withdrawn
IEEE Standard Definitions of Terms for Antennas
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 175.00 USD more info
IEEE 145-2013 (06/03/2014) Withdrawn
IEEE Standard for Definitions of Terms for Antennas
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 87.00 USD more info
IEEE 1450-1999 (01/09/1999) Withdrawn
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 399.00 USD more info
IEEE 1450.1-2005 (30/09/2005) Withdrawn
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 389.00 USD more info
IEEE 1450.2-2002 (18/03/2003) Withdrawn
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 225.00 USD more info
IEEE 1450.3-2007 (07/09/2007) Withdrawn
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 153.00 USD more info
IEEE 1450.6-2005 (05/04/2006) Withdrawn
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
Available languages: English
Available design: electronic (protected pdf) - Immediate download, Print design
from 153.00 USD more info
IEEE 1450.6.1-2009 (13/07/2009) Withdrawn
IEEE Standard for Describing On-Chip Scan Compression
Available languages: English
Available design: electronic (protected pdf) - Immediate download, Print design
from 146.00 USD more info
IEEE 1451.0-2007 (21/09/2007) Withdrawn
IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) Formats
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 186.00 USD more info
Copyright © All rights reserved | This template is made with by Colorlib
