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IEEE - Advanced technology for mankind
Page 293
IEEE 1671.2-2012 (15/02/2013) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
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IEEE 1671.3-2007 (28/03/2008) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
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IEEE 1671.4-2007 (30/04/2008) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
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IEEE 1671.5-2008 (01/02/2012) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
Available languages: English
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IEEE 1671.5-2015 (08/05/2015) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
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IEEE 1671.6-2008 (01/02/2013) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
Available languages: English
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IEEE 1671.6-2015 (08/05/2015) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
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Available design: electronic (protected pdf), Print design
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IEEE 1672-2006 (04/05/2007) Withdrawn
IEEE Standard for Ultrawideband Radar Definitions
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IEEE 1672-2006/Cor 1-2008 (10/11/2008) Withdrawn
IEEE Standard for Ultrawideband Radar Definitions - Corrigendum 1
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IEEE 1675-2008 (07/01/2009) Withdrawn
IEEE Standard for Broadband Over Powerline Hardware
Available languages: English
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