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IEEE - Advanced technology for mankind
Page 309
IEEE 252-1977 (12/08/1977) Withdrawn
IEEE Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap
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IEEE 252-1995 (30/11/1995) Withdrawn
IEEE Standard Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap
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IEEE 254-1963 (15/11/1963) Withdrawn
IEEE Standard Definitions of Parametric Device Terms
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IEEE 255-1963 (01/12/1963) Withdrawn
IEEE Standard Letter Symbols for Semiconductor Devices
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IEEE 256-1963 (20/12/1963) Withdrawn
IEEE Test Procedure for Semiconductor Diodes
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IEEE 257-1964 (30/04/1964) Withdrawn
IEEE Technical Committee Report on Recommended Practices for Burst Measurements in the Time Domain
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IEEE 258-1965 (15/01/1965) Withdrawn
IEEE Test Procedure for Close-Talking Pressure-Type Microphones
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IEEE 259-1965 (31/12/1964) Withdrawn
IEEE Proposed Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers
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IEEE 259-1974 (22/08/1974) Withdrawn
IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers
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IEEE 259-1994 (01/12/1994) Withdrawn
IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers
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