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STN - Slovak standards
Page 2951
STN EN 170100 (01/07/2002)
Sectional Specification: Waveguide type dielectric resonators
Available languages: English
Available design: Print design
STN EN 170101 (01/07/2002)
Blank detail Specification: Waveguide type dielectric resonators. Capability approval
Available languages: English
Available design: Print design
STN EN 61338-1 (01/08/2005)
Waveguide type dielectric resonators Part 1: Generic specification
Available languages: English
Available design: Print design
STN EN 170000 (01/11/2000) Withdrawn
Generic specification: Waveguide type dielectric resonators
Available design: Print design
STN EN 61337-1 (01/07/2005)
Filters using waveguide type dielectric resonators Part 1: Generic specification
Available languages: English
Available design: Print design
STN EN 61337-1-1 (01/12/2000)
Filters using waveguide type dielectric resonators. Part 1: General information, standard values and test conditions. Section 1: General information and standard values
Available languages: English
Available design: Print design
STN EN 61338-1-3 (01/12/2000)
Waveguide type dielectric resonators. Part 1-3: General information and test conditions. Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
Available languages: English
Available design: Print design
STN EN 61338-1-4 (01/09/2006)
Waveguide type dielectric resonators Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
Available languages: English
Available design: Print design
STN EN 61338-1-4:2006/OpravaC1 (01/03/2007) Correction
Waveguide type dielectric resonators Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
Available languages: English
Available design: Print design
STN EN 61338-1-5 (01/02/2016)
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
Available languages: English
Available design: Print design
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