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Withdrawn | Published: 10/06/2003
ASTM E1161-03 Withdrawn
Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
Available languages: English
Available design: Online Secure PDF
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Detail information
Designation: ASTM E1161-03
Publication date: 10/06/2003
Pages: 4
Note: Withdrawn
Country: American technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Keywords:electronic devices, nondestructive testing, radiographic, radioscopy, semiconductors, X-Ray
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