Withdrawn | Published: 01/06/2009

ASTM E1161-09 Withdrawn

Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

Available languages: English

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Detail information

Designation: ASTM E1161-09

Publication date: 01/06/2009

Pages: 10

Note: Withdrawn

Country: American technical standard

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Keywords:
capacitor, diode, electronic device, hybrid, inductor, microcircuits, microcircuit array, monolithic, multichip, nondestructive testing, radiographic, radiologic, radiology, radioscopy, rectifier, relay, resistor, semiconductor, switches, transformer, transistor, tunnel diode, voltage regulator, x-ray, Defects--semiconductors, Electrical conductors (semiconductors), Electronic materials/applications, Radiographic examination, Sealing glass defects, Voids, X-irradiation

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