ASTM E1737-96 Withdrawn

Detail information

Designation: ASTM E1737-96

Publication date: 01/01/1996

Pages: 24

Note: Withdrawn

Country: American technical standard

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Keywords:
Compact (C(T)) specimens, Cracking-crack growth, Direct current electric potential, Disk-shaped compact (DC(T)) specimens, Fracture toughness, J-integral (Jic), J-R curves, Multispecimen testing, Pin-loaded compact (C(T)) specimens, Pin-loaded disk-shaped compact (DC(T)) specimens, Single edge bend (SE(B)) specimens, Toughness, fracture toughness-J-integral characterization, test,, Stable crack extension, fracture toughness-J-integral characterization,test,,Order Form