Withdrawn | Published: 01/05/2009

ASTM E1829-09 Withdrawn

Standard Guide for Handling Specimens Prior to Surface Analysis

Available languages: English

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Detail information

Designation: ASTM E1829-09

Publication date: 01/05/2009

Pages: 5

Note: Withdrawn

Country: American technical standard

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Keywords:
Auger electron spectroscopy, secondary ion mass spectrometry, specimen handling, surface analysis, X-ray photoelectron spectroscopy, Specimen preparation (for testing)--spectrochemical analysis, Surface analysis--spectrochemical analysis, Auger electron spectroscopy (AES), SIMS (secondary ion mass spectrometry), X-ray photoelectron spectroscopy (XPS), ICS Number Code 71.040.50 (Physicochemical methods of analysis)

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