Withdrawn | Published: 01/06/2004

ASTM E1855-04e1 Withdrawn

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors (Includes all amendments And changes 8/16/2017).

Available languages: English

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Detail information

Designation: ASTM E1855-04e1

Publication date: 01/06/2004

Pages: 11

Note: Withdrawn

Country: American technical standard

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Keywords:
displacement damage, neutron damage, radiation hardness, silicon transistors, spectrum sensors, ICS Number Code 31.200 (Integrated circuits. Microelectronics)

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