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Withdrawn | Published: 10/12/1996
ASTM E1855-96 Withdrawn
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Available languages: English
Available design: Online Secure PDF
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Detail information
Designation: ASTM E1855-96
Publication date: 10/12/1996
Pages: 11
Note: Withdrawn
Country: American technical standard
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Keywords:Displacement damage, Neutron damage, Radiation hardness, Silicon transistors, Spectrum sensors, ICS Number Code 31.200 (Integrated circuits. Microelectron)
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