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Withdrawn | Published: 01/11/2011
ASTM E2245-11e1 Withdrawn
Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer (Includes all amendments And changes 5/28/2018).
Available languages: English
Available design: Online Secure PDF
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Detail information
Designation: ASTM E2245-11e1
Publication date: 01/11/2011
Pages: 25
Note: Withdrawn
Country: American technical standard
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Keywords:cantilevers, combined standard uncertainty, fixed-fixed beams, interferometry, length measurements, microelectromechanical systems, MEMS, polysilicon, residual strain, round robin, stiction, strain gradient, test structure, ICS Number Code 37.040.20 (Photographic paper, film and plates. Cartridges)
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