Withdrawn | Published: 10/06/2000

ASTM E668-00 Withdrawn

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

Available languages: English

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Detail information

Designation: ASTM E668-00

Publication date: 10/06/2000

Pages: 18

Note: Withdrawn

Country: American technical standard

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Keywords:
Absorbed radiation dose, Dosimetry, Electrical conductors-semiconductors, Electronic hardness, Electronic materials/applications, Electron radiation, Energy deposition-ionizing radiation, Gamma radiation-electronic components/devices, Hardness tests-radiation (of semiconductors), Radiation-hardness testing, Silicon semiconductors, Thermoluminescent dosimeter (TLD), Threshold detectors-60 MeV, X-irradiation, absorbed dose in radiation-hardness testing-electronic

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