Withdrawn | Published: 15/02/2005

ASTM E722-04e2 Withdrawn

Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics (Includes all amendments And changes 12/31/2010).

Available languages: English

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Detail information

Designation: ASTM E722-04e2

Publication date: 15/02/2005

Pages: 17

Note: Withdrawn

Country: American technical standard

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Keywords:
displacement damage, electronic hardness, gallium arsenide, hardness parameter, silicon, silicon damage, silicon equivalent damage (SED), 1-MeV equivalent fluence, ICS Number Code 31.080.01 (Semi-conductor devices in general)

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