Withdrawn | Published: 01/06/2009

ASTM E722-09e1 Withdrawn

Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics (Includes all amendments And changes 10/20/2014).

Available languages: English

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Detail information

Designation: ASTM E722-09e1

Publication date: 01/06/2009

Pages: 27

Note: Withdrawn

Country: American technical standard

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Keywords:
displacement damage, electronic hardness, gallium arsenide, hardness parameter, silicon, silicon damage, silicon equivalent damage (SED), 1-MeV equivalent fluence, Displacement--electronic materials/applications, Electrical conductors (semiconductors), Electronic hardness, Gamma radiation--electronic components/devices, 1MeV equivalent fluence, Neutron flux/fluence, Neutron sensors, Radiation-hardness testing, Silicon equivalent damage (SED), Silicon semiconductors

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