Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Withdrawn | Published: 01/01/2014
ASTM E766-14e1 Withdrawn
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope (Includes all amendments And changes 11/19/2019).
Available languages: English
Available design: Online Secure PDF
from 77.80 EUR
show on eshop
Detail information
Designation: ASTM E766-14e1
Publication date: 01/01/2014
Pages: 6
Note: Withdrawn
Country: American technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Keywords:calibration, magnification, pitch, scanning electron microscope, SEM,, ICS Number Code 37.020 (Optical equipment)
Popular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
