Withdrawn | Published: 01/01/1999

ASTM F1048-87(1999) Withdrawn

Standard Test Method for Measuring the Effective Surface Roughness of Optical Components by Total Integrated Scattering (Withdrawn 2003)

Available languages: English

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Detail information

Designation: ASTM F1048-87(1999)

Publication date: 01/01/1999

Pages: 5

Note: Withdrawn

Country: American technical standard

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Keywords:
Dielectrics, Diffuse reflectance, Effective surface roughness, Flat optical surfaces, Helium-neon laser, Integrated light scattering, Lasers and laser applications, Light-scattering, Metal mirrors, Microroughness, Mirrors, Monitoring-semiconductor processing, Nondestructive evaluation (NDE)-semiconductors, Radiation exposure-electronic components/devices, Reflectance and reflectivity-electronic materials/applications, Roughness, Scattering parameters, Solar collectors, Solar spectral irradiance

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