Withdrawn | Published: 10/01/1999

ASTM F1190-93 Withdrawn

Standard Guide for Neutron Irradiation of Unbiased Electronic Components

Available languages: English

Available design: Online Secure PDF

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Detail information

Designation: ASTM F1190-93

Publication date: 10/01/1999

Pages: 5

Note: Withdrawn

Country: American technical standard

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Keywords:
Destructive testing-semiconductors, Dosimetry, Electrical conductors-semiconductors, Equivalent monoenergetic neutron fluence, Exposure tests, Fast burst reactors (FBR), Gallium arsenide, Gamma radiation, Germanium-semiconductor applications, Irradiance/irradiation-semiconductors, MeV equivalent fluence, Neutron radiation, Nickel, Radiation exposure-electronic components/devices, Semiconductor wafer, Silicon-semiconductor applications, Sulfur, Thermal neutron radiation

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