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Withdrawn | Published: 01/06/2014
ASTM F1262M-14 Withdrawn
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)
Available languages: English
Available design: Online Secure PDF
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Detail information
Designation: ASTM F1262M-14
Publication date: 01/06/2014
Pages: 6
Note: Withdrawn
Country: American technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Keywords:digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold, ICS Number Code 031.200 ()
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