Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Withdrawn | Published: 01/01/2000
ASTM F1388-92(2000) Withdrawn
Standard Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors (Withdrawn 2003)
Available languages: English
Available design: Online Secure PDF
from 77.80 EUR
show on eshop
Detail information
Designation: ASTM F1388-92(2000)
Publication date: 01/01/2000
Pages: 7
Note: Withdrawn
Country: American technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Keywords:capacitance-time measurements, C-t measurements, generation lifetime, lifetime, generation velocity, MOS capacitor, silicon, ICS Number Code 31.060.01 (Capacitors in general)
Popular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
