Withdrawn | Published: 01/07/2006

ASTM F1892-06 Withdrawn

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

Available languages: English

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Detail information

Designation: ASTM F1892-06

Publication date: 01/07/2006

Pages: 40

Note: Withdrawn

Country: American technical standard

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Keywords:
ASIC (application specific integrated circuit), bipolar, cobalt 60 testing, gamma ray tests, ionizing radiation testing, MOS, radiation hardness, semiconductor devices, time dependent effects, total dose testing, X-ray testing, ICS Number Code 31.080.01 (Semi-conductor devices in general)

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