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Active standard | Published: 30/06/2008
BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory.
Available languages: English
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Detail information
Designation: BS EN 60749-38:2008
Publication date: 30/06/2008
Pages: 16
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 54875 8 Status: DefinitivePopular Publishers
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