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Active standard | Published: 22/11/2022
BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer.
Available languages: English
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Detail information
Designation: BS EN IEC 60749-37:2022
Publication date: 22/11/2022
Pages: 28
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 539 15199 2 Status: DefinitivePopular Publishers
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