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Active standard | Published: 15/03/2018
BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices. Electromechanical relaxation test method for freestanding conductive thin-films under room temperature.
Available languages: English
Available design: PDF - Immediate download, Print design
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Detail information
Designation: BS IEC 62047-29:2017
Publication date: 15/03/2018
Pages: 16
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 94013 2 Status: DefinitivePopular Publishers
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