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Active standard | Published: 24/04/2019
BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices. Environmental and dielectric withstand test methods for MEMS piezoelectric thin films.
Available languages: English
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Detail information
Designation: BS IEC 62047-36:2019
Publication date: 24/04/2019
Pages: 20
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 99118 9 Status: DefinitivePopular Publishers
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