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Active standard | Published: 28/08/2024
BS IEC 62047-47:2024
Semiconductor devices. Micro-electromechanical devices. Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures.
Available languages: English
Available design: electronic design (pdf), Print design
from 214.40 USD
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Detail information
Designation: BS IEC 62047-47:2024
Publication date: 28/08/2024
Pages: 20
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 539 21851 0 Status: DefinitivePopular Publishers
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