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Active standard | Published: 30/09/2010
BS ISO 17331:2004+A1:2010
Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy.
Available languages: English
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Detail information
Designation: BS ISO 17331:2004+A1:2010
Publication date: 30/09/2010
Pages: 28
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 64479 5 Status: DefinitivePopular Publishers
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