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Withdrawn | Published: 01/05/2010
ČSN EN 60749-20-ed.2 Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
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Detail information
Designation: ČSN EN 60749-20-ed.2
Publication date: 01/05/2010
Pages: 40
Note: Withdrawn
Country: Czech technical standard
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