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Withdrawn | Published: 01/09/2008
ČSN EN 60749-37 Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
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Detail information
Designation: ČSN EN 60749-37
Publication date: 01/09/2008
Pages: 28
Note: Withdrawn
Country: Czech technical standard
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