ČSN EN 62878-1-1

Device embedded substrate - Part 1-1: Generic specification - Test methods

Available languages: English

Available design: Print design

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Detail information

Designation: ČSN EN 62878-1-1

Publication date: 01/12/2015

Pages: 64

Country: Czech technical standard

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Anotation

This part of IEC 62878 specifies the test methods of passive and active device embedded sub-strates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3.
This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.
The IEC 62878 series neither applies to the re-distribution layer (RDL) nor to the electronic modules defined as an M-type business model in IEC 62421

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