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Active standard | Published: 01/10/2025
ČSN EN IEC 62276-ed.4
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
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Detail information
Designation: ČSN EN IEC 62276-ed.4
Publication date: 01/10/2025
Pages: 52
Country: Czech technical standard
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This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonatorsPopular Publishers
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