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Active standard | Published: 19/09/2005
GB/T 19922-2005
Standard test methods for measuring site flatness on silicon wafers by noncontact scanning
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 6 579.90 CZK
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Detail information
Designation: GB/T 19922-2005
Publication date: 19/09/2005
Pages: 0
Country: Chinese technical standard
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