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Active standard | Published: 30/06/2025
GB/T 20176-2025
Surface chemical analysis—Secondary-ion mass spectrometry—Determination of boron atomic concentration in silicon using uniformly doped materials
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 532.80 USD
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Detail information
Designation: GB/T 20176-2025
Publication date: 30/06/2025
Pages: 0
Country: Chinese technical standard
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