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Active standard | Published: 24/07/2024
GB/T 24578-2024
Test method for measuring surface metal contamination on semiconductor wafers —Total reflection X-Ray fluorescence spectroscopy
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 478.80 USD
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Detail information
Designation: GB/T 24578-2024
Publication date: 24/07/2024
Pages: 0
Country: Chinese technical standard
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