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Active standard | Published: 09/03/2022
GB/T 24581-2022
Test method for and impurities content in single crystal silicon—Low temperature FT-IR analysis method
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 4 497.10 CZK
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Detail information
Designation: GB/T 24581-2022
Publication date: 09/03/2022
Pages: 0
Country: Chinese technical standard
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