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Active standard | Published: 12/11/2013
GB/T 29849-2013
Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 250.80 USD
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Detail information
Designation: GB/T 29849-2013
Publication date: 12/11/2013
Pages: 0
Country: Chinese technical standard
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