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Active standard | Published: 27/03/2014
GB/T 30701-2014
Surface chemical analysisChemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
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Detail information
Designation: GB/T 30701-2014
Publication date: 27/03/2014
Pages: 0
Country: Chinese technical standard
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