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Active standard | Published: 24/07/2014
GB/T 30869-2014
Test method for thickness and total thickness variation of silicon wafers for solar cell
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 4 734.70 CZK
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Detail information
Designation: GB/T 30869-2014
Publication date: 24/07/2014
Pages: 0
Country: Chinese technical standard
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