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Active standard | Published: 03/07/2015
GB/T 31854-2015
Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 155.90 EUR
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Detail information
Designation: GB/T 31854-2015
Publication date: 03/07/2015
Pages: 0
Country: Chinese technical standard
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